Selected Publications

1. W. K. Chu, J. W. Mayer and M. A. Nicolet, Backscattering spectroscopy, Academic Press 1978. (book)

 

2. W. K. Chu, J. W. Mayer, M. A. Nicolet, T. M. Buck, G. Amsel and F. Eisen, Principles and Applications of Ion-Beam Techniques for Analysis of Solids and Thin Films,  Thin Solid Films, 17 (1): 1-41 1973.

 

3. W. K. Chu, Calculation of Energy Straggling for Protons and Helium Ions, Physical Review A, 13 (6) 2057-2060 1976.

 

4. W. K. Chu, S. S. Lau, J. W Mayer and H. Muller, Implanted Noble-Gas Atoms as Diffusion Markers in Silicide Formation, Thin Solid Films, 25 (2) 393-402 1975.

 

5. J. F. Ziegler, C. P. Wu, P. Williams, C. W. White, B. Terreault, B. M. U. Scherzer, R. L. Schulte, E. J. Scheid, C. W. Magee, E. Ligeon, J. Lecuyer, W. A. Lanford, F. J. Kuehne, E. A. Kamykowski, W. O. Hofer, A. Guivarch, C. H. Filleux, V. R. Deline, C. A. Evans, B. L. Cohen, G. J. Clark, W. K. Chu, C. Brassard, R. S. Blewer, R. Behrisch, B. R. Appleton and D. D. Allred, Profiling Hydrogen in Materials using Ion Beams, Nuclear Instruments and Methods, 149 (1) 19-39 1978.

 

6. K. N. Tu, W. K. Chu and J. W. Mayer, Structure and Growth Kinetics of NI2SI on Silicon, Thin Solid Films, 25 (2) 403-413 1975.

 

7. W. K. Chu and D. Powers, Alpha-particle Stopping Cross Section in Solids from 400 keV to 2 MeV, Physical Review, 187 (2) 478- 1969.

 

8. C. L. Chen, H. H. Feng, Z. Zhang, A. Brazdeikis, Z. J. Huang, W. K. Chu, C. W. Chu, F. A. Miranda, F. W. Van Keuls, R. R. Romanofsky and Y. Liou, Epitaxial ferroelectric Ba0.5Sr0.5TiO3 thin films for room temperature tunable element applications  Applied Physics Letters, 75 (3) 412-414 1999.

 

9. R. P. Sharma, S. B. Ogale, Z. H. Zhang, J. R. Liu, W. K. Chu, B. Veal, A. Paulikas, H. Zheng and T. Venkatesan,  Phase transitions in the incoherent lattice fluctuations in YBa2Cu3O7-delta, Nature, 404 (6779) 736-740 2000.

 

10. W. K. Chu, H. Krautle, J. W. Mayer, H. Muller, M. A. Nicolet and K. N. Tu, Identification of Dominant Diffusing Species in Silicide formation, Applied Physics Letters, 25 (8) 454-457 1974.