Capabilities
JEOL JXA-8600
1. Four wavelength dispersive spectrometers for quantitative elemental analysis
2. Beryllium window Energy Dispersive Spectrometer
3. Backscattered and secondary electron imaging
4. X-ray mapping
5. Stage automation for unattended operation
6. Analysis for elements from Be to U
7. On-line ZAF and 0PZ matrix corrections
8. Thin-film analysis
